US 12,359,983 B2
High accuracy computational method in resistance temperature detector measurements
Rajkumar Perumal, Karnataka (IN); Nageswara Rao Kalluri, Karnataka (IN); Pravinsharma Kaliyannan Eswaran, Karnataka (IN); Sridhar Katakam, Karnataka (IN); and Surendra Somasekhar Valleru, Karnataka (IN)
Assigned to HAMILTON SUNDSTRAND CORPORATION, Charlotte, NC (US)
Filed by Hamilton Sundstrand Corporation, Charlotte, NC (US)
Filed on Jun. 22, 2022, as Appl. No. 17/846,059.
Claims priority of application No. 202211024116 (IN), filed on Apr. 25, 2022.
Prior Publication US 2023/0341274 A1, Oct. 26, 2023
Int. Cl. G01K 7/16 (2006.01); G01K 1/022 (2021.01); G01K 7/20 (2006.01); G01K 7/22 (2006.01)
CPC G01K 7/16 (2013.01) [G01K 1/022 (2013.01); G01K 7/20 (2013.01); G01K 7/22 (2013.01); G01K 2219/00 (2013.01)] 19 Claims
OG exemplary drawing
 
1. A resistance temperature detector comprising:
a current source;
a single channel analog to digital converter (ADC) comprising a first channel input and a reference voltage input;
a resistance temperature detector (RTD) element connected to the first channel input and to the current source;
a current sense element connected in series with the RTD element between the RTD element and ground, wherein the current sense element is connected to the reference voltage input;
a controller configured to:
receive an output of the single channel ADC to determine a temperature at the RTD element, wherein the output of the single channel ADC comprises a bit representation of a ratio between a first voltage across the RTD element and a reference voltage across the current sense element.