US 12,358,927 B2
IRAK4 inhibitor crystal and preparation method therefor
Yang Zhang, Shanghai (CN); Jianfei Wang, Shanghai (CN); Haizhong Tan, Shanghai (CN); Yuhai Xing, Shanghai (CN); Jian Li, Shanghai (CN); and Shuhui Chen, Shanghai (CN)
Assigned to Chia Tai Tianqing Pharmaceutical Group Co., Inc., Lianyungang (CN)
Appl. No. 17/792,792
Filed by CHIA TAI TIANQING PHARMACEUTICAL GROUP CO., LTD., Lianyungang (CN)
PCT Filed Jan. 21, 2021, PCT No. PCT/CN2021/073152
§ 371(c)(1), (2) Date Jul. 14, 2022,
PCT Pub. No. WO2021/147968, PCT Pub. Date Jul. 29, 2021.
Claims priority of application No. 202010071573.9 (CN), filed on Jan. 21, 2020; and application No. 202010753615.7 (CN), filed on Jul. 30, 2020.
Prior Publication US 2023/0060905 A1, Mar. 2, 2023
Int. Cl. C07D 513/04 (2006.01)
CPC C07D 513/04 (2013.01) [C07B 2200/13 (2013.01)] 6 Claims
OG exemplary drawing
 
1. A crystalline form of a compound of formula (II),

OG Complex Work Unit Chemistry
having characteristic diffraction peaks in an X-ray powder diffraction pattern using Cu Kα radiation at the following 2θ: 6.25±0.20°, 12.58±0.20°, 14.33±0.20°, 16.15±0.20°, 20.00±0.20°, 20.57±0.20°, 21.79±0.20° and 28.02±0.20°; or, having characteristic diffraction peaks in an X-ray powder diffraction pattern using Cu Kα radiation at the following 2θ: 6.25±0.20°, 16.15±0.20° and 21.79±0.20°; or, having characteristic diffraction peaks in an X-ray powder diffraction pattern using Cu Kα radiation at the following 2θ: 6.25±0.20°, 12.58±0.20°, 14.33±0.20°, 16.15±0.20°, 20.00±0.20°, 21.53±0.20° and 21.79±0.20°; or, having characteristic diffraction peaks in an X-ray powder diffraction pattern using Cu Kα radiation at the following 2θ: 6.25±0.20°, 12.58±0.20°, 14.33±0.20°, 16.15±0.20°, 20.00±0.20°, 20.57±0.20°, 21.79±0.20° and 28.02±0.20°; or, having characteristic diffraction peaks in an X-ray powder diffraction pattern using Cu Kα radiation at the following 2θ: 6.25±0.20°, 11.95±0.20°, 12.58±0.20°, 14.33±0.20°, 16.15±0.20°, 19.46±0.20°, 20.00±0.20°, 20.57±0.20°, 21.79±0.20°, 23.87±0.20°, 28.02±0.20° and 30.81±0.20°; or, having characteristic diffraction peaks in an X-ray powder diffraction pattern using Cu Kα radiation at the following 2θ: 6.25±0.20°, 8.06±0.20°, 9.29±0.20°, 11.95±0.20°, 12.58±0.20°, 14.33±0.20°, 16.15±0.20°, 16.41±0.20°, 19.46±0.20°, 20.00±0.20°, 20.57±0.20°, 21.53±0.20°, 21.79±0.20°, 27.71±0.20° and 28.02±0.20°; or, having an XRPD pattern using Cu Kα radiation at the following 2θ: 6.25±0.20°, 8.06±0.20°, 9.29±0.20°, 11.50±0.20°, 11.95±0.20°, 12.58±0.20°, 14.33±0.20°, 16.15±0.20°, 16.41±0.20°, 18.20±0.20°, 18.75±0.20°, 19.46±0.20°, 20.00±0.20°, 20.57±0.20°, 21.53±0.20°, 21.79±0.20°, 23.1±10.20°, 23.87±0.20°, 24.31±0.20°, 25.26±0.20°, 26.14±0.20°, 26.70±0.20°, 27.71±0.20°, 28.02±0.20°, 28.50±0.20°, 29.09±0.20°, 30.06±0.20°, 30.81±0.20°, 32.39±0.20°, 33.21±0.20° and 33.71±0.20°.