US 12,358,214 B2
Monitoring and process control of the additive manufacture of a workpiece
Thomas Engel, Aalen (DE); Matthias Goldammer, Munich (DE); Andreas Graichen, Norrköping (SE); Clemens Otte, Munich (DE); and Axel Reitinger, Munich (DE)
Assigned to Siemens Aktiengesellschaft, Munich (DE)
Appl. No. 17/432,316
Filed by SIEMENS AKTIENGESELLSCHAFT, Munich (DE)
PCT Filed Feb. 13, 2020, PCT No. PCT/EP2020/053683
§ 371(c)(1), (2) Date Aug. 19, 2021,
PCT Pub. No. WO2020/169433, PCT Pub. Date Aug. 27, 2020.
Claims priority of application No. 19158124 (EP), filed on Feb. 19, 2019.
Prior Publication US 2022/0168840 A1, Jun. 2, 2022
Int. Cl. B23K 26/03 (2006.01); B22F 10/28 (2021.01); B22F 10/31 (2021.01); B22F 10/366 (2021.01); B22F 10/38 (2021.01); B22F 10/85 (2021.01); B22F 12/44 (2021.01); B22F 12/49 (2021.01); B22F 12/90 (2021.01); B23K 26/34 (2014.01); B29C 64/153 (2017.01); B33Y 10/00 (2015.01); B33Y 30/00 (2015.01); B33Y 50/02 (2015.01)
CPC B29C 64/153 (2017.08) [B22F 10/366 (2021.01); B22F 12/44 (2021.01); B22F 12/49 (2021.01); B22F 12/90 (2021.01); B23K 26/034 (2013.01); B23K 26/34 (2013.01); B33Y 10/00 (2014.12); B33Y 30/00 (2014.12); B33Y 50/02 (2014.12); B22F 10/28 (2021.01); B22F 10/31 (2021.01); B22F 10/38 (2021.01); B22F 10/85 (2021.01)] 12 Claims
OG exemplary drawing
 
1. A device for additive manufacture of a workpiece, the device comprising:
a scanner configured to direct a fusing beam onto a tracing point on a tracing surface;
a light-field camera that has a spatially resolving optical detector;
an imaging device configured and arranged to image a subregion of the tracing surface at least two-dimensionally using the spatially resolving optical detector, the spatially resolving optical detector being configured to generate at least one detector signal based on the image of the subregion, wherein the imaging device includes a beam splitter that is arranged on an input side of the scanner in a beam path of the fusing beam;
a controller configured to activate the device to change a position of the subregion during manufacture; and
a processor configured to evaluate, process, or evaluate and process the at least one detector signal,
wherein the beam splitter is configured to allow light that impinges on the beam splitter from the subregion via the imaging device to be coupled out and directed onto the spatially resolving optical detector.