US 12,033,717 B2
Calibration circuit and semiconductor device including the same
Jaehyeok Baek, Suwon-si (KR); Daehyun Kwon, Suwon-si (KR); Hyejung Kwon, Seoul (KR); Donggun An, Suwon-si (KR); and Daewoong Lee, Suwon-si (KR)
Assigned to Samsung Electronics Co., Ltd., Suwon-si (KR)
Filed by Samsung Electronics Co., Ltd., Suwon-si (KR)
Filed on Sep. 6, 2022, as Appl. No. 17/903,578.
Claims priority of application No. 10-2021-0178532 (KR), filed on Dec. 14, 2021; and application No. 10-2022-0029491 (KR), filed on Mar. 8, 2022.
Prior Publication US 2023/0186958 A1, Jun. 15, 2023
Int. Cl. G11C 7/10 (2006.01)
CPC G11C 7/1048 (2013.01) [G11C 2207/2254 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A calibration circuit, comprising:
a first pull-up unit, a second pull-up unit and a third pull-up unit each connected to a first power supply node configured to supply a first power supply voltage;
a first pull-down unit and a second pull-down unit each connected to a second power supply node configured to supply a second power supply voltage smaller than the first power supply voltage;
a first code generator configured to generate a first code by comparing a voltage of a pad at which the first pull-up unit is connected to an external resistor with a reference voltage;
a second code generator configured to generate a second code by comparing a voltage of a first intermediate node with the reference voltage and output the second code to the first and second pull-down units, the first intermediate node between the second pull-up unit and a coil, the second pull-up unit configured to provide resistance according to the first code or a shift code obtained by shifting the first code; and
a third code generator configured to generate a third code by comparing a voltage of a second intermediate node between the second pull-down unit and the third pull-up unit with the reference voltage.