US 12,032,434 B2
Machine learning supplemented storage device inspections
Abhishek Srivastava, San Jose, CA (US); Karthik Venkatesh, Thornton, CO (US); and Bernhard E. Knigge, San Jose, CA (US)
Assigned to Western Digital Technologies, Inc., San Jose, CA (US)
Filed by Western Digital Technologies, Inc., San Jose, CA (US)
Filed on May 10, 2022, as Appl. No. 17/741,217.
Prior Publication US 2023/0367667 A1, Nov. 16, 2023
Int. Cl. G06F 11/00 (2006.01); G06F 11/07 (2006.01); G06N 3/08 (2023.01)
CPC G06F 11/079 (2013.01) [G06F 11/073 (2013.01); G06N 3/08 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A method comprising: processing a plurality of disks within a storage device, wherein the plurality of disks comprise a plurality of tracks and at least one of the plurality of disks is processed by: scanning a subset of the plurality of tracks for defects; generating sparse map data based on the scanned tracks; reconstructing the generated sparse map data to prepare the data for input into one or more machine learning process; inputting the reconstructed sparse map data into the one or more machine learning processes, wherein the one or more machine learning processes generates an output; in response to a background process being available, selecting a dense scan area based on the available sparse map data; and evaluating the plurality of disks comprising the plurality of tracks that were scanned based on the output of the one or more machine learning processes.