US 12,032,186 B2
Spectral filter, and image sensor and electronic device including spectral filter
Jaesoong Lee, Suwon-si (KR); and Hyochul Kim, Suwon-si (KR)
Assigned to SAMSUNG ELECTRONICS CO., LTD., Suwon-si (KR)
Filed by SAMSUNG ELECTRONICS CO., LTD., Suwon-si (KR)
Filed on Apr. 22, 2022, as Appl. No. 17/727,329.
Claims priority of application No. 10-2021-0052531 (KR), filed on Apr. 22, 2021; and application No. 10-2022-0032230 (KR), filed on Mar. 15, 2022.
Prior Publication US 2022/0342129 A1, Oct. 27, 2022
Int. Cl. H04N 5/335 (2011.01); G02B 5/28 (2006.01); H04N 23/55 (2023.01); H04N 25/11 (2023.01)
CPC G02B 5/28 (2013.01) [H04N 23/55 (2023.01); H04N 25/11 (2023.01)] 26 Claims
OG exemplary drawing
 
1. A spectral filter comprising:
a first metal reflection layer;
a second metal reflection layer disposed above the first metal reflection layer;
a plurality of resonators disposed between the first metal reflection layer and the second metal reflection layer; and
a bandpass filter disposed below the first metal reflection layer or above the second metal reflection layer, the bandpass filter comprising a plurality of band filters transmitting light in a plurality of wavelength regions,
wherein the plurality of band filters are disposed in one-to-one correspondence to the plurality of resonators that are configured to transmit light having a central wavelength,
wherein each of the plurality of band filters transmit light in a corresponding wavelength region,
wherein each of the plurality of resonators, corresponding to each of the plurality of band filters, outputs the light having the central wavelength in the corresponding wavelength region of the corresponding band filter among the plurality of band filters,
wherein each of the plurality of resonators comprises a base and at least one pattern disposed in the base, a material of the base being different from a material of the at least one pattern.