US 12,032,020 B2
Calibration data generation circuit and associated method
Chun-Yi Kuo, Hsinchu (TW); Ying-Yen Chen, Hsinchu (TW); and Hsiao Tzu Liu, Hsinchu (TW)
Assigned to REALTEK SEMICONDUCTOR CORPORATION, Hsinchu (TW)
Filed by REALTEK SEMICONDUCTOR CORPORATION, Hsinchu (TW)
Filed on Dec. 21, 2022, as Appl. No. 18/069,479.
Claims priority of application No. 111102610 (TW), filed on Jan. 21, 2022.
Prior Publication US 2023/0236246 A1, Jul. 27, 2023
Int. Cl. G01R 31/28 (2006.01); G01R 31/3185 (2006.01)
CPC G01R 31/318552 (2013.01) [G01R 31/318541 (2013.01)] 19 Claims
OG exemplary drawing
 
1. A calibration data generation circuit, comprising:
a first delay unit, having first delay amount;
a first scan path, comprising:
a first scan flip-flop, comprising:
a scan data input terminal;
a clock input terminal, configured to receive a clock signal; and
an output terminal; and
a second scan flip-flop, comprising:
a scan data input terminal, coupled to the output terminal of the first scan flip-flop;
a clock input terminal, configured to receive a first delayed clock signal formed by the clock signal passing through the first delay unit; and
an output terminal; and
a second scan path, comprising:
a third scan flip-flop, comprising:
a scan data input terminal;
a clock input terminal, configured to receive the clock signal; and
an output terminal; and
a fourth scan flip-flop, comprising:
a scan data input terminal, coupled to the output terminal of the third scan flip-flop;
a clock input terminal, configured to receive the first delayed clock signal; and
an output terminal;
wherein when the calibration data generation circuit is configured to perform a first scan shift operation on the first scan path and a second scan shift operation on the second scan path, the first scan flip-flop and the second scan flip-flop are configured in a scan shift mode to obtain a first scan shift result for calibrating a default timing derate factor, and the third scan flip-flop and the fourth scan flip-flop are configured in the scan shift mode to obtain a second scan shift result for calibrating the default timing derate factor.