US 11,699,871 B2
Board-like connector, dual-arm bridge of board-like connector, and wafer testing assembly
Kai-Chieh Hsieh, Taoyuan (TW); Chao-Chiang Liu, Taoyuan (TW); Meng-Chieh Cheng, Taipei (TW); and Wei-Jhih Su, Taichung (TW)
Assigned to CHUNGHWA PRECISION TEST TECH. CO., LTD., Taoyuan (TW)
Filed by CHUNGHWA PRECISION TEST TECH. CO., LTD., Taoyuan (TW)
Filed on Sep. 27, 2021, as Appl. No. 17/485,722.
Claims priority of application No. 109138250 (TW), filed on Nov. 3, 2020.
Prior Publication US 2022/0140515 A1, May 5, 2022
Int. Cl. H01R 13/24 (2006.01); H01L 21/66 (2006.01); H05K 1/18 (2006.01); G01R 31/26 (2020.01)
CPC H01R 13/2457 (2013.01) [G01R 31/2601 (2013.01); H01L 22/34 (2013.01); H05K 1/181 (2013.01); H05K 2201/10409 (2013.01)] 10 Claims
OG exemplary drawing
 
1. A wafer testing assembly, comprising:
a signal transmission board configured to be connected to a probe head, wherein the signal transmission board includes a plurality of connection pads;
a testing circuit board configured to be electrically coupled to a testing apparatus, wherein the testing circuit board includes a plurality of metal pads spaced apart from each other; and
a board-like connector sandwiched between the signal transmission board and the testing circuit board, wherein the board-like connector includes:
a plurality of dual-arm bridges spaced apart from each other, wherein each of the dual-arm bridges includes:
a carrier;
a first cantilever and a second cantilever both extending from inner lateral walls of the carrier and both being coplanar with the carrier;
a first abutting column extending from the first cantilever along a first direction; and
a second abutting column extending from the second cantilever along a second direction that is opposite to the first direction; and
an insulating layer connecting the carriers of the dual-arm bridges, wherein the first abutting column and the second abutting column of each of the dual-arm bridges respectively protrude from two opposite sides of the insulating layer;
wherein the first abutting columns of the dual-arm bridges respectively abut against the connection pads of the signal transmission board, and the second abutting columns of the dual-arm bridges respectively abut against the metal pads of the testing circuit board;
wherein the signal transmission board and the testing circuit board are electrically coupled to each other through the board-like connector.