US 11,699,568 B2
Method and device for spatial charged particle bunching
Mark Joseph Bennahmias, Mission Viejo, CA (US); Michael John Zani, Laguna Niguel, CA (US); and Jeffrey Winfield Scott, Carpenteria, CA (US)
Assigned to NextGen Semi Holding, Inc., Laguna Niguel, CA (US)
Filed by NexGen Semi Holding, Inc., Laguna Niguel, CA (US)
Filed on Apr. 19, 2022, as Appl. No. 17/659,800.
Application 17/659,800 is a continuation of application No. 17/222,756, filed on Apr. 5, 2021, granted, now 11,335,537.
Application 17/222,756 is a continuation of application No. 16/532,368, filed on Aug. 5, 2019, granted, now 10,991,545, issued on Apr. 27, 2021.
Application 16/532,368 is a continuation of application No. 12/459,478, filed on Jun. 30, 2009, abandoned.
Claims priority of provisional application 61/133,604, filed on Jun. 30, 2008.
Prior Publication US 2022/0254603 A1, Aug. 11, 2022
This patent is subject to a terminal disclaimer.
Int. Cl. H01J 37/30 (2006.01); H01J 37/31 (2006.01); H01J 37/317 (2006.01)
CPC H01J 37/3007 (2013.01) [H01J 37/3174 (2013.01); H01J 2237/04 (2013.01)] 22 Claims
OG exemplary drawing
 
1. A charged particle bunching system comprising:
a series of electrodes arranged to generate a shaped electric field, the series comprising a first electrode, a last electrode and one or more intermediate electrodes; and
a waveform device attached to the electrodes and configured to apply a periodic potential waveform to each electrode independently in a manner so as to form a quasi-electrostatic time varying potential gradient between adjacent electrodes and to spatially distribute charged particles propagating along the series of electrodes to form a charged particle beam comprising a plurality of nodes and antinodes, wherein the nodes have a charged particle density and the antinodes have substantially no charged particle density.