US 11,699,472 B2
Semiconductor memory device and memory system including the same
Hojun Yoon, Suwon-si (KR); Youngchul Cho, Suwon-si (KR); Youngdon Choi, Suwon-si (KR); Changsik Yoo, Suwon-si (KR); and Junghwan Choi, Suwon-si (KR)
Assigned to SAMSUNG ELECTRONICS CO., LTD., Suwon-si (KR)
Filed by Samsung Electronics Co., Ltd., Suwon-si (KR)
Filed on Nov. 15, 2021, as Appl. No. 17/526,398.
Claims priority of application No. 10-2021-0051584 (KR), filed on Apr. 21, 2021.
Prior Publication US 2022/0343957 A1, Oct. 27, 2022
Int. Cl. G11C 7/22 (2006.01); G11C 7/10 (2006.01)
CPC G11C 7/222 (2013.01) [G11C 7/1057 (2013.01); G11C 7/1084 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A semiconductor memory device comprising:
a data clock buffer configured to generate first through fourth clock signals based on a data clock signal received from a memory controller;
a quadrature error correction circuit configured to receive the first through fourth clock signals, configured to perform a locking operation to generate a first corrected clock signal and a second corrected clock signal which have a phase difference of 90 degrees with respect to each other by adjusting at least one of a skew and a duty error of at least some of the first through fourth clock signals in a first operation mode based on an initialization command and configured to perform a relocking operation to lock the second corrected clock signal to the first corrected clock signal in response to a relock signal in a second operation mode;
a clock generation circuit configured to generate an output clock signal and a strobe signal based on the first corrected clock signal and the second corrected clock signal; and
a data input/output (I/O) buffer configured to generate a data signal by sampling data from a memory cell array based on the output clock signal and configured to transmit the data signal and the strobe signal to the memory controller.