US 11,698,630 B2
Abnormality analysis device, abnormality analysis method, and manufacturing system
Hiroshi Amano, Osaka (JP); Narumi Atsuta, Fukuoka (JP); Noriaki Hamada, Kanagawa (JP); Yosuke Tajika, Hyogo (JP); Nobutaka Kawaguchi, Osaka (JP); Yuichi Higuchi, Osaka (JP); and Taichi Shimizu, Osaka (JP)
Assigned to PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD., Osaka (JP)
Appl. No. 16/973,917
Filed by PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD., Osaka (JP)
PCT Filed Jun. 7, 2019, PCT No. PCT/JP2019/022667
§ 371(c)(1), (2) Date Dec. 10, 2020,
PCT Pub. No. WO2019/240019, PCT Pub. Date Dec. 19, 2019.
Claims priority of application No. 2018-111048 (JP), filed on Jun. 11, 2018.
Prior Publication US 2021/0208578 A1, Jul. 8, 2021
Int. Cl. G05B 23/02 (2006.01); G05B 19/418 (2006.01)
CPC G05B 23/0235 (2013.01) [G05B 19/418 (2013.01); G05B 23/0272 (2013.01); G05B 23/0281 (2013.01)] 11 Claims
OG exemplary drawing
 
1. An abnormality analysis device that analyzes an abnormality in a manufacturing system that manufactures products by operating a plurality of constituent elements, the abnormality analysis device comprising:
an overall information obtainer that obtains overall information indicating an overall feature amount of the manufacturing system;
an overall abnormal degree calculator that calculates an overall abnormal degree that is an abnormal degree of a whole of the manufacturing system by statistically processing the overall information;
an individual information obtainer that obtains individual information indicating a feature amount of each of the plurality of constituent elements;
an individual abnormal degree calculator that calculates an individual abnormal degree that is an abnormal degree of each of the plurality of constituent elements by statistically processing the individual information;
a determiner that determines whether the overall abnormal degree exceeds a first threshold value; and
a decider that decides an abnormal constituent element among the plurality of constituent elements, based on a plurality of individual abnormal degrees each being the individual abnormal degree calculated by the individual abnormal degree calculator, wherein
the individual abnormal degree calculator calculates the individual abnormal degree when the determiner determines that the overall abnormal degree exceeds the first threshold value,
the overall abnormal degree calculator further calculates a partial abnormal degree by statistically processing partial information obtained by excluding feature amounts of the abnormal constituent element from the overall information, the partial abnormal degree being an abnormal degree of a partial system obtained by excluding the abnormal constituent element from the manufacturing system, when the overall abnormal degree is determined to exceed the first threshold value, and
the determiner further determines whether the partial abnormal degree exceeds a second threshold value.