US 11,698,577 B2
Imaging system comprising beam guidance element with high solarization resistance in the visible spectral range
Ralf Jedamzik, Griesheim (DE); Peter Naß, Mainz (DE); Sebastian Leukel, Mainz (DE); Volker Hagemann, Nieder-Olm (DE); and Uwe Petzold, Osthofen (DE)
Assigned to Schott AG, Mainz (DE)
Filed by Schott AG, Mainz (DE)
Filed on May 28, 2021, as Appl. No. 17/333,621.
Prior Publication US 2021/0373426 A1, Dec. 2, 2021
Int. Cl. G03B 21/20 (2006.01)
CPC G03B 21/2033 (2013.01) 14 Claims
OG exemplary drawing
 
1. An imaging system, comprising:
at least one laser light source selected from the group consisting of a laser light source B having a wavelength λB in the spectral range of 380 nm to 490 nm, a laser light source G having a wavelength λG in the spectral range of >490 nm to 585 nm, and a laser light source R having a wavelength λR in the spectral range of >585 nm to 750 nm; and
a beam guidance element, wherein the laser light source is suitable to generate in at least one point of the beam guidance element a mean surface power density of more than 10 W/cm2, and the beam guidance element consists of a glass having a quality factor F(436 nm)=S(436 nm)*(Ext0(436 nm)+Ext1(436 nm))/k, wherein S(436 nm) is a thermality at a wavelength of 436 nm, Ext1(436 nm) is an additional absorbance in comparison to Ext0(436 nm) at a wavelength of 436 nm of a sample having a thickness of 10 mm after an irradiation of 15 hours with a HOK 4 lamp, Ext0(436 nm) is an absorbance at a wavelength of 436 nm of a sample having a thickness of 10 mm without irradiation with a HOK 4 lamp, and k is a thermal conductivity, and wherein F(436 nm) is <700 ppm/W.