US 11,698,406 B2
Circuit for testing monitoring circuit and operating method thereof
Hyunseok Nam, Yongin-si (KR); and Sangyoung Lee, Seoul (KR)
Assigned to SAMSUNG ELECTRONICS CO., LTD.
Filed by SAMSUNG ELECTRONICS CO., LTD., Suwon-si (KR)
Filed on Jul. 10, 2020, as Appl. No. 16/925,389.
Claims priority of application No. 10-2019-0162913 (KR), filed on Dec. 9, 2019.
Prior Publication US 2021/0172999 A1, Jun. 10, 2021
Int. Cl. G01R 31/28 (2006.01); G01R 31/3167 (2006.01)
CPC G01R 31/2829 (2013.01) [G01R 31/3167 (2013.01); G01R 31/2856 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A test circuit for testing a monitoring circuit, the test circuit comprising:
a ramp generator configured to generate a ramp signal in response to activation of a first control signal;
a counter configured to count pulses of a clock signal in response to the activation of the first control signal;
at least one register configured to store an output value of the counter based on a change in an output signal generated by the monitoring circuit in response to the ramp signal; and
a controller configured to generate the first control signal, wherein the first control signal is configured to cause the monitoring circuit to be set to a test mode in response to the activation of the first control signal, and
wherein the controller is further configured to verify operation of the monitoring circuit based on a ratio of at least one value stored in the at least one register, wherein the at least one value is obtained while the monitoring circuit is set to the test mode.