US 11,698,307 B2
Methods and apparatus to trim temperature sensors
Nathan Richard Schemm, Rowlett, TX (US)
Assigned to TEXAS INSTRUMENTS INCORPORATED, Dallas, TX (US)
Filed by Texas Instruments Incorporated, Dallas, TX (US)
Filed on Dec. 31, 2019, as Appl. No. 16/731,910.
Claims priority of provisional application 62/955,564, filed on Dec. 31, 2019.
Prior Publication US 2021/0199515 A1, Jul. 1, 2021
Int. Cl. G01K 7/16 (2006.01); G01K 15/00 (2006.01); G05B 11/01 (2006.01); H01L 23/34 (2006.01)
CPC G01K 15/005 (2013.01) [G01K 7/16 (2013.01); G01K 15/007 (2013.01); G05B 11/018 (2013.01); H01L 23/34 (2013.01)] 7 Claims
OG exemplary drawing
 
1. An apparatus comprising:
a first die including:
a first transistor having a first channel including a first material; and
a temperature coefficient resistor having a first terminal and a second terminal, the temperature coefficient resistor including a resistance dependent on a temperature of the first die;
a second die including:
a second transistor having a second channel including a second material;
a variable current source including an output, a first input adapted to be coupled to an adjustment device, and a second input coupled to a voltage supply node;
a first temperature sensor configured to measure a value indicative of a temperature of the second die; and
a second temperature sensor including:
a reference voltage coupled to the second terminal of the temperature coefficient resistor;
an amplifier including an output and including a first input coupled to the output of the variable current source and the first terminal of the temperature coefficient resistor; and
a third transistor including a first current terminal coupled to the voltage supply, a second current terminal coupled to an output voltage, and a control terminal coupled to the output of the amplifier; and
a package including the first die and the second die.