US 12,355,652 B2
Functional testing of NF device
Sandeep Bagchi, Bangalore (IN); and Nayan Sen, Bangalore (IN)
Assigned to RAKUTEN SYMPHONY, INC., Tokyo (JP)
Appl. No. 18/014,058
Filed by Rakuten Symphony, Inc., Tokyo (JP)
PCT Filed Dec. 27, 2022, PCT No. PCT/US2022/082401
§ 371(c)(1), (2) Date Dec. 30, 2022,
PCT Pub. No. WO2024/107235, PCT Pub. Date May 23, 2024.
Claims priority of application No. 202241065147 (IN), filed on Nov. 14, 2022.
Prior Publication US 2024/0223487 A1, Jul. 4, 2024
Int. Cl. H04L 43/50 (2022.01); G06F 11/3668 (2025.01)
CPC H04L 43/50 (2013.01) [G06F 11/3684 (2013.01); G06F 11/3688 (2013.01)] 14 Claims
OG exemplary drawing
 
1. An electronic device for performing functional testing of a network function (NF) device, wherein the electronic device comprises:
a memory;
a processor coupled to the memory;
a communicator coupled to the memory and the processor and wherein the processor is configured to:
receive a specification corresponding to a service to be tested on a device under test (DUT), wherein the specification comprises a plurality of methods of the service to be tested;
generate a proto file based on the specification, wherein the proto file comprises a plurality of messages and definitions associated with a plurality of Remote Procedure Calls (RPCs) for enabling communication with a test harness manager of the electronic device:
generate a plurality of test scripts based on the generated proto file;
invoking, by the electronic device, at least one RPC of the plurality of RPCs based on at least one test script to be executed on the DUT; and
perform the functional testing based on the invoked at least one RPC for testing the at least one method of the service on the DUT, wherein the DUT is the NF device.