US 12,355,498 B2
Measurement application device calibration unit, measurement system, method
Florian Ramian, Karlsfeld (DE); Florian Gerbl, Olching (DE); and Daniel Mueller-Remer, Munich (DE)
Assigned to ROHDE & SCHWARZ GMBH & CO. KG, Munich (DE)
Filed by ROHDE & SCHWARZ GMBH & CO. KG, Munich (DE)
Filed on Jul. 28, 2022, as Appl. No. 17/815,757.
Prior Publication US 2024/0039644 A1, Feb. 1, 2024
Int. Cl. G01R 35/00 (2006.01); G01R 31/28 (2006.01); H04B 17/00 (2015.01); H04B 17/11 (2015.01)
CPC H04B 17/11 (2015.01) [G01R 31/2824 (2013.01); H04B 17/0085 (2013.01)] 18 Claims
OG exemplary drawing
 
1. A measurement application device calibration unit, comprising:
at least one coupling element comprising:
a first connection and a second connection for coupling the coupling element into a signal measurement path that is coupled to a measurement application device; and
a third connection;
wherein the coupling element is configured to at least one of couple out a signal from the signal measurement path into the third connection, and couple in a signal from the third connection into the signal measurement path; and
a signal processing device that is coupled to the third connection of the coupling element and that is configured:
to receive a predetermined calibration signal when the coupling element couples out a signal from the signal measurement path into the third connection; and
to generate the predetermined calibration signal when the coupling element couples in a signal from the third connection into the signal measurement path,
wherein the measurement application device is configured to calibrate the signal measurement path based on:
the calibration signal measured by the measurement application device calibration unit, or
the calibration signal as coupled into the signal measurement path and measured by the measurement application device;
wherein when calibrating the measurement application device is configured to determine a mismatch between a first impedance and a second impedance;
wherein the first impedance comprises an impedance from a reference plane towards a device under test, and wherein the second impedance comprises an impedance from the reference plane towards the measurement application device.