US 12,354,985 B2
Memory device including memory chip and peripheral memory chip and method of manufacturing the memory device
Jooyong Park, Hwaseong-si (KR); Chanho Kim, Seoul (KR); Pansuk Kwak, Seoul (KR); and Daeseok Byeon, Seongnam-si (KR)
Assigned to Samsung Electronics Co., Ltd., Gyeonggi-do (KR)
Filed by Samsung Electronics Co., Ltd., Suwon-si (KR)
Filed on Jun. 2, 2023, as Appl. No. 18/328,359.
Application 18/328,359 is a continuation of application No. 17/381,782, filed on Jul. 21, 2021, granted, now 11,721,655.
Claims priority of application No. 10-2020-0155424 (KR), filed on Nov. 19, 2020.
Prior Publication US 2023/0317655 A1, Oct. 5, 2023
This patent is subject to a terminal disclaimer.
Int. Cl. H01L 21/66 (2006.01); H01L 23/00 (2006.01); H01L 25/00 (2006.01); H01L 25/065 (2023.01); H01L 25/18 (2023.01)
CPC H01L 24/08 (2013.01) [H01L 22/20 (2013.01); H01L 24/80 (2013.01); H01L 25/0657 (2013.01); H01L 25/18 (2013.01); H01L 25/50 (2013.01); H01L 2224/08145 (2013.01); H01L 2224/80895 (2013.01); H01L 2224/80896 (2013.01); H01L 2224/80908 (2013.01); H01L 2225/06596 (2013.01); H01L 2924/1431 (2013.01); H01L 2924/14511 (2013.01)] 15 Claims
OG exemplary drawing
 
1. A memory device, comprising:
a memory chip including
a memory cell array connected to first word lines and first bit lines,
first word line bonding pads respectively connected to the first word lines, and
first bit line bonding pads respectively connected to the first bit lines; and
a peripheral circuit chip, wherein the peripheral circuit chip includes
a test cell array connected to second word lines and second bit lines,
second word line bonding pads respectively connected to the first word line bonding pads,
second bit line bonding pads respectively connected to the first bit line bonding pads, and
a peripheral circuit connected to the second word line bonding pads and the second word lines, or the second bit line bonding pads and the second bit lines,
wherein the peripheral circuit includes a row decoder connected to the memory cell array through the first and second word line bonding pads and the first word lines and connected to the test cell array through the second word lines.