US 12,352,945 B2
Microscope device, spectroscope, and microscope system
Tetsuro Kuwayama, Tokyo (JP); Hirokazu Tatsuta, Tokyo (JP); and Gakuji Hashimoto, Tokyo (JP)
Assigned to SONY GROUP CORPORATION, Tokyo (JP)
Appl. No. 17/756,226
Filed by SONY GROUP CORPORATION, Tokyo (JP)
PCT Filed Nov. 20, 2020, PCT No. PCT/JP2020/043346
§ 371(c)(1), (2) Date May 19, 2022,
PCT Pub. No. WO2021/106772, PCT Pub. Date Jun. 3, 2021.
Claims priority of application No. 2019-217406 (JP), filed on Nov. 29, 2019.
Prior Publication US 2022/0413275 A1, Dec. 29, 2022
Int. Cl. G02B 21/08 (2006.01); G01J 3/02 (2006.01); G01J 3/04 (2006.01); G01J 3/18 (2006.01); G01J 3/28 (2006.01)
CPC G02B 21/082 (2013.01) [G01J 3/0208 (2013.01); G01J 3/04 (2013.01); G01J 3/18 (2013.01); G01J 3/2823 (2013.01); G01J 2003/045 (2013.01)] 16 Claims
OG exemplary drawing
 
1. A microscope device comprising:
an opening that includes a first slit and a second slit through which a plurality of pieces of light from an observation target resulting from a plurality of pieces of irradiation light emitted to the observation target and having different wavelengths pass;
a dispersion element that wavelength-disperses the plurality of pieces of light passing through the opening; and
an imaging element that receives the plurality of pieces of light wavelength-dispersed by the dispersion element,
wherein the imaging element performs light reception so that, as for the plurality of pieces of light wavelength-dispersed, zeroth-order light of light passing through the second slit and first-order light of light passing through the first slit do not overlap with each other.