US 12,352,810 B2
System for testing performance of device in temperature load test
Taek Seon Lee, Hwaseong-si (KR); Ho Nam Kim, Seongnam-si (KR); Sung Chul Moon, Gunpo-si (KR); Sang Bong Lee, Suwon-si (KR); and Se I Mi Choi, Anyang-si (KR)
Assigned to ATECO INC., Gunpo-si (KR)
Filed by ATECO INC., Gunpo-si (KR)
Filed on Jun. 27, 2023, as Appl. No. 18/341,860.
Claims priority of application No. 10-2023-0009679 (KR), filed on Jan. 25, 2023.
Prior Publication US 2024/0248133 A1, Jul. 25, 2024
Int. Cl. G01R 31/28 (2006.01); G01R 1/04 (2006.01)
CPC G01R 31/2874 (2013.01) [G01R 1/0441 (2013.01)] 12 Claims
OG exemplary drawing
 
1. A system for testing the performance of a device, the system comprising:
a tester including a plurality of sockets capable of making electrical contact with a plurality of devices inserted therein, and testing performance of the devices;
a pusher including a plurality of push bodies for pushing the devices in a direction of the sockets, by which the plurality of devices are inserted into the plurality of sockets;
a first temperature regulator which is connected to a first region between the pusher and the tester and maintains a temperature of the first region within a predetermined temperature range during the test on the plurality of devices, the first region being a space between some of the plurality of sockets and the pusher; and
a second temperature regulator which is connected to a second region between the pusher and the tester and maintains the temperature of the second region within a predetermined temperature range during the test on the plurality of devices, the second region being a space between some other sockets and the pusher.