US 11,054,356 B2
Particle characterisation with a focus tuneable lens
Jason Cecil William Corbett, Malvern (GB); and David Bryce, Malvern (GB)
Assigned to Malvern Panalytical Limited, Malvern (GB)
Appl. No. 16/492,329
Filed by Malvern Panalytical Limited, Malvern (GB)
PCT Filed Oct. 24, 2017, PCT No. PCT/GB2017/053204
§ 371(c)(1), (2) Date Sep. 9, 2019,
PCT Pub. No. WO2018/162869, PCT Pub. Date Sep. 13, 2018.
Application 16/492,329 is a continuation in part of application No. 15/454,814, filed on Mar. 9, 2017, granted, now 10,365,198, issued on Jul. 30, 2019.
Prior Publication US 2020/0166446 A1, May 28, 2020
Int. Cl. G01N 15/02 (2006.01); G01N 15/00 (2006.01)
CPC G01N 15/0211 (2013.01) [G01N 2015/0046 (2013.01); G01N 2015/0222 (2013.01); G01N 2015/03 (2013.01)] 19 Claims
OG exemplary drawing
 
1. A particle characterisation apparatus for performing a static light scattering measurement or a dynamic light scattering measurement comprising:
a light source for illuminating a sample with a light beam, whereby the light beam reaches the sample from the light source along an illumination optical path length;
a detector arranged to detect scattered light from the interaction of the light beam with the sample, whereby the scattered light reaches the detector along a detection optical path length;
a focus tuneable lens arranged to collect the scattered light for the detector from a scattering volume and/or to direct the light beam into the sample;
a focusing reflector configured to direct at least one of the illumination optical path into the sample and the detection optical path from the sample toward the detector; and
wherein the focus tuneable lens is configured to vary the light beam position and/or light beam width incident on the focusing reflector.