| CPC H01L 21/02315 (2013.01) [H01J 37/32119 (2013.01); H01J 37/32651 (2013.01); H01L 21/02348 (2013.01); H01L 21/67207 (2013.01); H01J 37/32449 (2013.01); H01L 21/263 (2013.01); H01L 21/762 (2013.01)] | 15 Claims |

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1. A plasma processing apparatus, comprising:
a plasma chamber comprises a plasma region;
a dielectric wall forming at least a portion of the plasma chamber;
an inductive coupling element located proximate the dielectric wall; and
an ultraviolet light source configured to emit an ultraviolet light beam through an ultraviolet emission assembly, the ultraviolet emission assembly comprises:
one or more metal surfaces facing an interior volume of the plasma chamber, the one or more metal surfaces arranged to emit one or more electrons into the plasma region; and
one or more reflective elements configured to reflect the ultraviolet light beam onto the one or more metal surfaces.
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