US 12,347,668 B2
Mass spectrometry via frequency tagging
Robert Graham Cooks, West Lafayette, IN (US); and Dalton Snyder, West Lafayette, IN (US)
Assigned to Purdue Research Foundation, West Lafayette, IN (US)
Filed by Purdue Research Foundation, West Lafayette, IN (US)
Filed on Apr. 9, 2024, as Appl. No. 18/630,314.
Application 18/630,314 is a continuation of application No. 17/284,144, granted, now 11,984,311, previously published as PCT/US2019/055112, filed on Oct. 8, 2019.
Claims priority of provisional application 62/743,600, filed on Oct. 10, 2018.
Prior Publication US 2024/0304434 A1, Sep. 12, 2024
Int. Cl. H01J 49/42 (2006.01); G01N 33/68 (2006.01); H01J 49/02 (2006.01)
CPC H01J 49/4225 (2013.01) [G01N 33/6848 (2013.01); H01J 49/025 (2013.01); H01J 49/429 (2013.01)] 17 Claims
OG exemplary drawing
 
1. A system comprising:
a mass spectrometer comprising a single ion trap; and
a central processing unit (CPU), and storage coupled to the CPU for storing instructions that when executed by the CPU cause the system to apply a plurality of scan functions to the single ion trap to fragment a precursor ion and simultaneously eject a product ion of the precursor ion in a manner that preserves in time a relationship of the precursor ion and the product ion, wherein the plurality of scan functions comprise a nonlinear AC frequency sweep at constant RF voltage while, simultaneously, the product ion of the precursor ion is ejected from the single ion trap using a time-varying broadband waveform, and wherein fragmentation time of the precursor ion correlates with ejection time of the product ion, allowing the relationship in time to be correlated to the precursor ion mass-to-charge.