US 12,347,085 B2
Method and device for detecting defect, storage medium and electronic device
Yaoping Wang, Beijing (CN); Meijuan Zhang, Beijing (CN); Wangqiang He, Beijing (CN); Dong Chai, Beijing (CN); and Hong Wang, Beijing (CN)
Assigned to BEIJING ZHONGXIANGYING TECHNOLOGY CO., LTD., Beijing (CN); and BOE TECHNOLOGY GROUP CO., LTD., Beijing (CN)
Appl. No. 17/772,562
Filed by Beijing Zhongxiangying Technology Co., Ltd., Beijing (CN); and BOE Technology Group Co., Ltd., Beijing (CN)
PCT Filed May 21, 2021, PCT No. PCT/CN2021/095306
§ 371(c)(1), (2) Date Apr. 28, 2022,
PCT Pub. No. WO2022/241784, PCT Pub. Date Nov. 24, 2022.
Prior Publication US 2024/0202893 A1, Jun. 20, 2024
Int. Cl. G06T 7/00 (2017.01); G06T 7/90 (2017.01); G06V 10/44 (2022.01); G06V 10/764 (2022.01); G06V 10/776 (2022.01)
CPC G06T 7/0002 (2013.01) [G06T 7/90 (2017.01); G06V 10/44 (2022.01); G06V 10/764 (2022.01); G06V 10/776 (2022.01); G06T 2200/24 (2013.01); G06T 2207/10024 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20092 (2013.01)] 19 Claims
OG exemplary drawing
 
1. A method for detecting defect, comprising:
acquiring a detection task, and acquiring various types of images corresponding to the detection task captured by an optical device on a display substrate during a production process of the display substrate;
acquiring defect detection models trained by a same initial model corresponding to the types of the images respectively; and
obtaining defect detection results by performing defect detection on respective type of images using the defect detection model corresponding to the type of the images.