US 12,346,643 B1
Testing integrated circuit designs with accelerated replay
Siddharth Malkani, Leander, TX (US); Horace Lau, Mountain View, CA (US); Sundeep Amirineni, Austin, TX (US); and Dana Michelle Vantrease, Austin, TX (US)
Assigned to Amazon Technologies, Inc., Seattle, WA (US)
Filed by Amazon Technologies, Inc., Seattle, WA (US)
Filed on Mar. 30, 2021, as Appl. No. 17/301,251.
Int. Cl. G06F 30/331 (2020.01)
CPC G06F 30/331 (2020.01) 20 Claims
OG exemplary drawing
 
1. A computer-implemented method for testing an integrated circuit design, the method comprising:
running a simulation that includes:
reading, by a controller model, controller instructions from a memory model;
executing, by the controller model, microcode to translate the controller instructions into device instructions for an integrated circuit design under test; and
dispatching, by the controller model, the device instructions onto a bus interface between the controller model and the integrated circuit design, wherein the device instructions are dispatched onto the bus interface with intervening idle cycles;
capturing bus interface activity on the bus interface to generate a stimulus file, wherein one or more of the intervening idle cycles are excluded from the stimulus file; and
executing a test bench driver to bypass the microcode and replay the simulation, wherein replaying the simulation includes:
reading, by the test bench driver, the stimulus file; and
injecting, by the test bench driver, the device instructions from the stimulus file into the integrated circuit design without the excluded one or more of the intervening idle cycles.