US 12,346,439 B2
Inspection system, inspection method, and computer program
Teruhiro Tagomori, Tokyo (JP)
Assigned to Nomura Research Institute, Ltd., Tokyo (JP)
Filed by NOMURA RESEARCH INSTITUTE, LTD., Toyko (JP)
Filed on Jul. 13, 2023, as Appl. No. 18/351,697.
Application 18/351,697 is a continuation of application No. 17/354,481, filed on Jun. 22, 2021, granted, now 11,741,229.
Application 17/354,481 is a continuation of application No. 16/591,915, filed on Oct. 3, 2019, granted, now 11,074,343, issued on Jul. 27, 2021.
Application 16/591,915 is a continuation of application No. PCT/JP2018/014256, filed on Apr. 3, 2018.
Claims priority of application No. 2017-073830 (JP), filed on Apr. 3, 2017.
Prior Publication US 2023/0359735 A1, Nov. 9, 2023
This patent is subject to a terminal disclaimer.
Int. Cl. G06F 21/56 (2013.01); H04L 9/40 (2022.01)
CPC G06F 21/561 (2013.01) [H04L 63/145 (2013.01); G06F 2221/034 (2013.01)] 16 Claims
OG exemplary drawing
 
1. A requester device comprising:
a processor configured to:
request inspection of electronic data by at least one inspection device;
record attribute information related to the electronic data, including at least one of an address of the electronic data or a hash value of the electronic data, in a blockchain network; and
record the electronic data in a predetermined area for retrieval by the at least one inspection device, wherein the predetermined area is outside the blockchain network.