US 12,345,820 B2
Measurement control apparatus, measurement system, measurement control method, and non-transitory computer readable medium
Akira Tsuji, Tokyo (JP)
Assigned to NEC CORPORATION, Tokyo (JP)
Appl. No. 17/781,553
Filed by NEC Corporation, Tokyo (JP)
PCT Filed Dec. 6, 2019, PCT No. PCT/JP2019/047730
§ 371(c)(1), (2) Date Jun. 1, 2022,
PCT Pub. No. WO2021/111609, PCT Pub. Date Jun. 10, 2021.
Prior Publication US 2022/0413153 A1, Dec. 29, 2022
Int. Cl. G06T 7/11 (2017.01); G01S 17/894 (2020.01)
CPC G01S 17/894 (2020.01) [G06T 7/11 (2017.01); G06T 2207/10028 (2013.01)] 19 Claims
OG exemplary drawing
 
1. A measurement control apparatus comprising:
at least one memory storing instructions, and
at least one processor configured to execute the instructions stored in the at least one memory to:
detect, by the at least one processor, an abnormal part of point group data acquired from a three-dimensional optical sensor;
control, by the at least one processor, the orientation of the three-dimensional optical sensor in accordance with the abnormal part that has been detected, the orientation of the three-dimensional optical sensor being changed to a direction, of measurement directions in which the abnormal part is not detected, in which the amount of change in the orientation is small; and
determine, by the at least one processor, the cause of the abnormality of the abnormal part based on the point group data measured by the three-dimensional optical sensor in the controlled orientation.