US 12,345,763 B2
Comparator testing circuit and testing method thereof
Chih-Ping Lu, Hsinchu (TW); and Cheng-Chih Wang, Hsinchu (TW)
Assigned to Nuvoton Technology Corporation, Hsinchu (TW)
Filed by Nuvoton Technology Corporation, Hsinchu (TW)
Filed on Sep. 25, 2023, as Appl. No. 18/473,299.
Claims priority of application No. 111137140 (TW), filed on Sep. 30, 2022.
Prior Publication US 2024/0110977 A1, Apr. 4, 2024
Int. Cl. H03K 5/24 (2006.01); G01R 31/3177 (2006.01); H03K 3/037 (2006.01); H03K 19/20 (2006.01)
CPC G01R 31/3177 (2013.01) [H03K 3/037 (2013.01); H03K 5/24 (2013.01); H03K 19/20 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A comparator testing circuit, comprising:
a switching circuit configured to receive a first signal, a second signal, and a switching signal, and output one of the first signal and the second signal as a first input signal and the other of the first signal and the second signal as a second input signal according to the switching signal;
a comparator coupled to the switching circuit and configured to compare the first input signal with the second input signal to generate an output signal; and
a determination circuit coupled to the switching circuit and the comparator and configured to determine whether the comparator is abnormal based on the switching signal and the output signal to generate an exception flag.