| CPC G01R 31/31724 (2013.01) [G01R 31/2874 (2013.01); G01R 31/3004 (2013.01); G01R 31/3167 (2013.01); G01R 31/31924 (2013.01); G01R 31/3274 (2013.01); H03K 19/01721 (2013.01)] | 20 Claims |

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1. A temperature measurement circuit comprising:
a band-gap reference circuit configured to generate a band-gap reference voltage that is fixed regardless of an operation temperature;
a reference voltage generator circuit configured to generate a measurement reference voltage by adjusting the band-gap reference voltage;
a sensing circuit configured to generate a temperature-variant voltage based on a bias current, wherein the temperature-variant voltage varies depending on the operation temperature;
an analog-digital converter circuit configured to generate a first digital code indicating the operation temperature based on the measurement reference voltage and the temperature-variant voltage; and
a digital built-in self-test (BIST) circuit configured to
apply a test signal to the analog-digital converter circuit,
receive a second digital code from the analog-digital converter circuit, and
generate a plurality of alarm signals based on the second digital code, wherein the plurality of alarm signals indicate an operation state of the analog-digital converter circuit.
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