US 12,345,745 B2
Threshold voltage detection method, detection device, and display device
Wei Dou, Guangdong (CN)
Assigned to SHENZHEN CHINA STAR OPTOELECTRONICS SEMICONDUCTOR DISPLAY TECHNOLOGY CO., LTD., Guangdong (CN)
Appl. No. 17/623,509
Filed by SHENZHEN CHINA STAR OPTOELECTRONICS SEMICONDUCTOR DISPLAY TECHNOLOGY CO., LTD., Guangdong (CN)
PCT Filed Dec. 22, 2021, PCT No. PCT/CN2021/140624
§ 371(c)(1), (2) Date Jun. 22, 2023,
PCT Pub. No. WO2023/108778, PCT Pub. Date Jun. 22, 2023.
Claims priority of application No. 202111555328.6 (CN), filed on Dec. 17, 2021.
Prior Publication US 2024/0044950 A1, Feb. 8, 2024
Int. Cl. G01R 19/165 (2006.01); G09G 3/3233 (2016.01)
CPC G01R 19/16576 (2013.01) [G09G 3/3233 (2013.01); G09G 2300/0819 (2013.01); G09G 2300/0842 (2013.01); G09G 2310/08 (2013.01); G09G 2320/0233 (2013.01); G09G 2320/045 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A threshold voltage detection method, comprising:
step S1, providing a pixel comprising a driving transistor, a first transistor, a second transistor, a capacitor, and a light-emitting element, wherein a gate electrode of the driving transistor is electrically connected to a first node, one of a source electrode and a drain electrode of the driving transistor is electrically connected to a first power source, another one of the source electrode and the drain electrode of the driving transistor is electrically connected to the second node, and wherein a gate electrode of the first transistor is electrically connected to a scan line, one of a source electrode and a drain electrode of the first transistor is electrically connected to a data line, another one of the source electrode and the drain electrode of the first transistor is electrically connected to the first node, and wherein a gate electrode of the second transistor is electrically connected to a control line, one of a source electrode and a drain electrode of the second transistor is electrically connected to the second node, and another one of the source electrode and the drain electrode of the second transistor is electrically connected to a sampling line, and wherein a first terminal of the capacitor is electrically connected to the first node, and a second terminal of the capacitor is electrically connected to the second node;
step S2, initializing a voltage of the first node to turn on the driving transistor;
step S3, maintaining a driving current flowing through the driving transistor unchanged, and detecting a voltage of the second node after a preset time period interval;
step S4: acquiring an initial threshold voltage according to the voltage of the second node and a preset voltage;
step S5: comparing the voltage of the second node with the preset voltage, and acquiring a target threshold voltage according to the initial threshold voltage if the voltage of the second node is equal to the preset voltage.