US 12,020,750 B2
Three-dimensional memory devices
Yuancheng Yang, Wuhan (CN); Wenxi Zhou, Wuhan (CN); Zhiliang Xia, Wuhan (CN); and Wei Liu, Wuhan (CN)
Assigned to YANGTZE MEMORY TECHNOLOGIES CO., LTD., Wuhan (CN)
Filed by YANGTZE MEMORY TECHNOLOGIES CO., LTD., Wuhan (CN)
Filed on Sep. 21, 2021, as Appl. No. 17/480,821.
Application 17/480,821 is a continuation of application No. PCT/CN2021/103610, filed on Jun. 30, 2021.
Prior Publication US 2023/0005541 A1, Jan. 5, 2023
Int. Cl. H10B 41/27 (2023.01); G11C 16/04 (2006.01); G11C 16/10 (2006.01); G11C 16/26 (2006.01); H01L 23/528 (2006.01); H10B 41/35 (2023.01); H10B 41/40 (2023.01); H10B 43/27 (2023.01); H10B 43/35 (2023.01); H10B 43/40 (2023.01)
CPC G11C 16/0483 (2013.01) [G11C 16/10 (2013.01); G11C 16/26 (2013.01); H01L 23/5283 (2013.01); H10B 41/27 (2023.02); H10B 41/35 (2023.02); H10B 41/40 (2023.02); H10B 43/27 (2023.02); H10B 43/35 (2023.02); H10B 43/40 (2023.02)] 17 Claims
OG exemplary drawing
 
1. A three-dimensional (3D) memory device, comprising:
a first semiconductor structure comprising:
an array of NAND memory strings; and
a first semiconductor layer in contact with sources of the array of NAND memory strings;
a second semiconductor structure comprising:
a first peripheral circuit of the array of NAND memory strings, the first peripheral circuit comprising a first transistor; and
a second semiconductor layer in contact with the first transistor;
a third semiconductor structure comprising:
a second peripheral circuit of the array of NAND memory strings, the second peripheral circuit comprising a second transistor; and
a third semiconductor layer in contact with the second transistor;
a first bonding interface between the first semiconductor structure and the second semiconductor structure, wherein the second semiconductor layer is between the first bonding interface and the first peripheral circuit; and
a second bonding interface between the second semiconductor structure and the third semiconductor structure, wherein the third semiconductor layer is between the second bonding interface and the second peripheral circuit.