US 12,342,648 B2
Spatial phase integrated wafer-level imaging
Blair Barbour, Windemere, FL (US); David Theodore Truch, Katy, TX (US); and Nicholas Englert, Orlando, FL (US)
Assigned to Photon-X, Inc., Kissimmee, FL (US)
Filed by Photon-X, Inc., Kissimmee, FL (US)
Filed on Nov. 16, 2021, as Appl. No. 17/527,799.
Application 17/527,799 is a continuation of application No. PCT/US2020/033101, filed on May 15, 2020.
Claims priority of provisional application 62/849,468, filed on May 17, 2019.
Prior Publication US 2022/0336511 A1, Oct. 20, 2022
Int. Cl. H10F 39/00 (2025.01); H04N 25/702 (2023.01); H04N 25/75 (2023.01); H10D 99/00 (2025.01); H10F 39/18 (2025.01); H10F 77/40 (2025.01); H10K 39/32 (2023.01); H10F 39/12 (2025.01)
CPC H10F 39/806 (2025.01) [H04N 25/702 (2023.01); H04N 25/75 (2023.01); H10D 99/00 (2025.01); H10F 39/024 (2025.01); H10F 39/026 (2025.01); H10F 39/18 (2025.01); H10F 39/80 (2025.01); H10F 39/8057 (2025.01); H10F 39/8063 (2025.01); H10F 77/40 (2025.01); H10K 39/32 (2023.02); H10F 39/184 (2025.01); H10F 39/199 (2025.01)] 34 Claims
OG exemplary drawing
 
1. An integrated imaging system, comprising:
an integrated image sensor, comprising:
a polarizer pixel configured to filter electromagnetic (EM) radiation and to allow filtered EM radiation having a selected polarization state to pass therethrough;
a radiation-sensing pixel configured to detect the filtered EM radiation and to generate a signal in response to detecting the filtered EM radiation; and
readout circuitry configured to perform analog preprocessing on the signal generated by the radiation-sensing pixel; and
a microlens array disposed above the integrated image sensor, the microlens array being configured to focus the electromagnetic radiation on the radiation-sensing pixel;
an edge processor of an array of edge processors, wherein the edge processor is dedicated to processing signals received from the integrated image sensor and configured to:
generate first-order primitives and second-order primitives based on the analog preprocessed signal from the readout circuitry; and
determine a plurality of features of an object located in a field-of-view of the radiation-sensing pixel based on the first-order primitives and the second-order primitives.