US 12,342,576 B2
Semiconductor devices
Jinkyung Son, Suwon-si (KR); Seungje Kim, Suwon-si (KR); Jiwon Park, Seoul (KR); Jaepo Lim, Seoul (KR); Minseok Jo, Suwon-si (KR); Seunghyun Lim, Seoul (KR); and Jinyoung Choi, Hwaseong-si (KR)
Assigned to SAMSUNG ELECTRONICS CO., LTD., Suwon-si (KR)
Filed by SAMSUNG ELECTRONICS CO., LTD., Suwon-si (KR)
Filed on Aug. 26, 2022, as Appl. No. 17/896,523.
Claims priority of application No. 10-2021-0175333 (KR), filed on Dec. 9, 2021.
Prior Publication US 2023/0187519 A1, Jun. 15, 2023
Int. Cl. H10D 30/67 (2025.01); H10D 30/01 (2025.01); H10D 30/43 (2025.01); H10D 62/10 (2025.01); H10D 62/13 (2025.01); H10D 64/01 (2025.01)
CPC H10D 30/6735 (2025.01) [H10D 30/014 (2025.01); H10D 30/031 (2025.01); H10D 30/43 (2025.01); H10D 30/6757 (2025.01); H10D 62/121 (2025.01); H10D 62/151 (2025.01); H10D 64/017 (2025.01); H10D 64/018 (2025.01)] 20 Claims
OG exemplary drawing
 
1. A semiconductor device comprising:
a substrate comprising an active region extending in a first direction;
an element isolation layer, adjacent to the active region, in the substrate;
a gate electrode on the substrate and extending in a second direction which crosses the first direction;
a plurality of channel layers on the active region, spaced apart from each other along a third direction perpendicular to an upper surface of the substrate, and surrounded by the gate electrode; and
a source/drain region provided in a recess of the active region adjacent to the gate electrode, and connected to the plurality of channel layers,
wherein, in the first direction, the gate electrode has a first length on the active region and a second length, greater than the first length, on the element isolation layer.