US 12,341,030 B2
Support unit and substrate treating apparatus
Kyung Man Kim, Seongnam-si (KR); Jeong Woo Han, Gunpo-si (KR); Ji-hwan Lee, Incheon (KR); Wan Jae Park, Hwaseong-si (KR); Yoon Jong Ju, Cheonan-si (KR); and Seong Hak Bae, Changwon-si (KR)
Assigned to SEMES CO., LTD., Chungcheongnam-Do (KR)
Filed by SEMES CO., LTD., Cheonan-si (KR)
Filed on Mar. 25, 2022, as Appl. No. 17/704,218.
Prior Publication US 2023/0307266 A1, Sep. 28, 2023
Int. Cl. H01L 21/67 (2006.01); H01L 21/683 (2006.01)
CPC H01L 21/67103 (2013.01) [H01L 21/67248 (2013.01); H01L 21/6833 (2013.01)] 17 Claims
OG exemplary drawing
 
1. A support unit for supporting a substrate, the support unit comprising:
a support plate configured to support a substrate, and which includes an electrostatic electrode providing electrostatic force to the substrate;
a heater provided inside the support plate and configured to heat the substrate;
an insulating plate provided under the support plate as an insulating substance; and
a bimetal member disposed inside the support plate and configured to compensate for bending of the support plate due to heat,
wherein the bimetal member includes,
a pin provided to be contactable with a bottom surface of the substrate that is placed on the support plate;
a circular shaped first member configured to support the pin, the pin coupled to an upper surface of the circular shaped first member; and
a ring shaped second member provided to surround the circular shaped first member, and
the pin is provided to move up or move down according to a difference in the amount of thermal deformation between the circular shaped first member and the ring-shaped second member,
wherein a movement direction of the pin according to the difference in the amount of thermal deformation between the circular shaped first member and the ring-shaped second member is a direction opposite to a direction in which the support plate is bent according to a difference in the amount of thermal deformation between the support plate and the insulating plate in a region in which the bimetal member is provided.