| CPC G09G 3/006 (2013.01) [G06F 3/0446 (2019.05); G09G 3/2096 (2013.01); G09G 2330/12 (2013.01)] | 20 Claims |
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1. An electronic device testing method comprising:
providing an electronic device including:
a display layer including a common electrode; and
a sensor layer disposed on the display layer and including a plurality of first electrodes and a plurality of second electrodes which insulatively intersect the plurality of first electrodes;
measuring a plurality of jitter values of a plurality of channels formed by the plurality of first electrodes and the plurality of second electrodes;
calculating a first value being an average of the plurality of jitter values;
calculating a second value by summing jitter values, among the plurality of jitter values, of channels formed by one of the plurality of second electrodes among the plurality of channels; and
testing the common electrode based on a third value obtained by dividing the second value by the first value.
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