US 12,340,041 B2
System for detecting and characterizing touch inputs at a human-computer interface
Jacob Terracina, Sunnyvale, CA (US); Ilya Daniel Rosenberg, Sunnyvale, CA (US); Shuangming Li, Sunnyvale, CA (US); Darren Lochun, Sunnyvale, CA (US); and Tomer Moscovich, Sunnyvale, CA (US)
Assigned to Sensel, Inc., Sunnyvale, CA (US)
Filed by Sensel, Inc., Sunnyvale, CA (US)
Filed on Mar. 15, 2024, as Appl. No. 18/607,048.
Application 18/607,048 is a continuation in part of application No. 18/207,603, filed on Jun. 8, 2023, granted, now 12,164,690.
Claims priority of provisional application 63/452,527, filed on Mar. 16, 2023.
Claims priority of provisional application 63/350,327, filed on Jun. 8, 2022.
Prior Publication US 2024/0281083 A1, Aug. 22, 2024
Int. Cl. G06F 3/041 (2006.01); G06F 3/044 (2006.01)
CPC G06F 3/04142 (2019.05) [G06F 3/04166 (2019.05); G06F 3/044 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A system for detecting force inputs comprising:
a substrate comprising a first edge supported by a chassis;
a first electrode spanning a first area on the substrate and arranged proximal a center of the substrate;
a second electrode spanning a second area, greater than the first area, on the substrate and interposed between the first electrode and the first edge of the substrate;
a baseplate arranged under the substrate;
a set of spacer elements:
interposed between the substrate and the baseplate; and
configured to support the substrate over the baseplate;
a first coupling region:
arranged on the baseplate;
facing the first electrode; and
electrically coupling to the first electrode to yield a first change in electrical values at the first electrode responsive to application of a first force magnitude proximal the center of the substrate; and
a second coupling region:
arranged on the baseplate;
facing the second electrode; and
electrically coupling to the second electrode to yield a second change in electrical values, approximating the first change in electrical values, at the second electrode responsive to application of a second force magnitude, approximating the first force magnitude, proximal the first edge of the substrate.