US 12,339,732 B2
Fault analysis device and fault analysis method thereof
Chien Yu Chen, New Taipei (TW); and Meng-Kai Hsieh, Nantou County (TW)
Assigned to NANYA TECHNOLOGY CORPORATION, New Taipei (TW)
Filed by NANYA TECHNOLOGY CORPORATION, New Taipei (TW)
Filed on Oct. 5, 2022, as Appl. No. 17/960,158.
Prior Publication US 2024/0118964 A1, Apr. 11, 2024
Int. Cl. G06F 11/07 (2006.01); H04L 41/0631 (2022.01)
CPC G06F 11/079 (2013.01) [H04L 41/0631 (2013.01)] 12 Claims
OG exemplary drawing
 
1. A fault analysis device, comprising:
a sensing circuit, sensing a first distorted signal on a first signal transmission path of an abnormal signal device when the abnormal signal device performs a preset operation; and
a signal generating circuit, providing a fault test signal to a second signal transmission path of a standard device corresponding to the first signal transmission path when the standard device performs the preset operation, so as to generate a second distorted signal on the second signal transmission path, wherein the first distorted signal and the second distorted signal have same signal distortion characteristics, and a circuit architecture of the standard device is the same as a circuit architecture of the abnormal signal device.