US 12,339,407 B2
Device for detecting charged particles or radiation
Laila Ambar Sari, Tokyo (JP); Shin Imamura, Tokyo (JP); Takumu Iwanaka, Tokyo (JP); and Yoshifumi Sekiguchi, Tokyo (JP)
Assigned to Hitachi High-Tech Corporation, Tokyo (JP)
Appl. No. 17/926,951
Filed by Hitachi High-Tech Corporation, Tokyo (JP)
PCT Filed Jun. 17, 2020, PCT No. PCT/JP2020/023741
§ 371(c)(1), (2) Date Nov. 21, 2022,
PCT Pub. No. WO2021/255853, PCT Pub. Date Dec. 23, 2021.
Prior Publication US 2023/0266485 A1, Aug. 24, 2023
Int. Cl. G01T 1/20 (2006.01)
CPC G01T 1/2018 (2013.01) [G01T 1/2002 (2013.01)] 19 Claims
OG exemplary drawing
 
1. A detection device that detects charged particles or radiation as detection targets, comprising:
a scintillator including a fluorescent layer that converts the detection target into light;
a light detector that detects light emitted from the scintillator;
a light guide provided between the scintillator and the light detector, the light guide comprising a plurality of dividing blocks, a discontinuous surface being present at a boundary of each of the plurality of dividing blocks; and
a shielding unit that partially shields at least one of the detection target incident on the scintillator and the light emitted from the scintillator, wherein
the scintillator has an incident surface on which the detection target is incident and an emission surface from which the light is emitted,
and the shielding unit is configured to divide the incident surface, a cross section, or the emission surface of the scintillator into a plurality of open regions,
the shielding unit is provided inside the fluorescent layer,
a thickness of the shielding unit is equal to or less than half a thickness of the fluorescent layer, and
a position of the shielding unit corresponds to at least one of the boundaries of the plurality of dividing blocks.