US 12,339,328 B2
Method for predicting a remaining failure or lifetime of an electrical component of an electrical circuit
Tobias Klein, Dornbirn (AT); Thomas Zengerle, Dornbirn (AT); Andreas Schmölzer, Dornbirn (AT); Markus Mayrhofer, Dornbirn (AT); Luis Javier Carracedo Cordovilla, Dornbirn (AT); and Ulrich Hüttinger, Dornbirn (AT)
Assigned to Tridonic GmbH & Co KG, Dornbirn (AT)
Appl. No. 18/549,401
Filed by Tridonic GmbH & Co KG, Dornbirn (AT)
PCT Filed Mar. 11, 2022, PCT No. PCT/EP2022/056300
§ 371(c)(1), (2) Date Sep. 7, 2023,
PCT Pub. No. WO2022/189613, PCT Pub. Date Sep. 15, 2022.
Claims priority of application No. 21161923 (EP), filed on Mar. 11, 2021.
Prior Publication US 2024/0159844 A1, May 16, 2024
Int. Cl. G01R 31/12 (2020.01); G01R 31/28 (2006.01); G01R 31/64 (2020.01)
CPC G01R 31/64 (2020.01) [G01R 31/282 (2013.01); G01R 31/2846 (2013.01); G01R 31/2849 (2013.01)] 16 Claims
OG exemplary drawing
 
1. A method for predicting failure or a remaining lifetime of a building management device or an electrical component of an electrical circuit, the electrical circuit being part of the building management device, wherein the method comprises:
observing or estimating at least one characteristic parameter of the building management device or the electrical component;
generating (S2) a temporal course of the characteristic parameter(s) based on the observed or estimated characteristic parameter(s); and
computing (S3), based on the temporal course of the characteristic parameter(s), an indicator for the failure or the remaining lifetime of the building management device or the electrical component;
wherein computing the indicator for the failure or the remaining lifetime comprises determining a degree of similarity between the temporal course of the characteristic parameter(s) with a pattern of the respective characteristic parameter(s) retrieved from a memory, wherein the pattern stored is associated with a failure to be expected and the characteristic parameter(s) is/are observed parameter(s).