US 12,339,305 B2
Method and system for real time outlier detection and product re-binning
Shaul Teplinsky, San Francisco, CA (US); Arie Peltz, Ness Ziona (IL); and Dan Sebban, Rishon LeZion (IL)
Assigned to OPTIMAL PLUS LTD., Holon (IL)
Filed by Optimal Plus Ltd., Holon (IL)
Filed on Nov. 16, 2023, as Appl. No. 18/511,705.
Application 18/511,705 is a continuation of application No. 17/863,261, filed on Jul. 12, 2022, granted, now 11,852,668.
Application 17/863,261 is a continuation of application No. 16/682,925, filed on Nov. 13, 2019, granted, now 11,402,419, issued on Aug. 2, 2022.
Claims priority of provisional application 62/760,327, filed on Nov. 13, 2018.
Prior Publication US 2024/0159813 A1, May 16, 2024
This patent is subject to a terminal disclaimer.
Int. Cl. G01R 31/01 (2020.01); B07C 5/344 (2006.01); G01R 31/317 (2006.01)
CPC G01R 31/01 (2013.01) [B07C 5/344 (2013.01); G01R 31/31718 (2013.01)] 12 Claims
OG exemplary drawing
 
1. A method for analyzing device test data, the method comprising:
accessing a core analytics rule for testing a device on a tester at a testing facility, the core analytics rule is based on manufacturing data of similar devices produced at different manufacturing locations;
receiving initial test results of a plurality of other similar devices tested at the testing facility;
generating, based on the initial test results, an edge analytics rule;
modifying the core analytics rule based on the edge analytics rule, wherein the modified core analytics rule includes modified binning limits;
applying the modified core analytics rule to testing data obtained by testing the first device while the first device is still on the tester; and
determining, based on applying the modified core analytics rule, that the first device is an outlier with respect to the modified binning limits.