US 12,337,530 B2
Method for calibrating an irradiation device for an apparatus for additively manufacturing three-dimensional objects
Moritz Beck, Bamberg (DE); and Christian Dicken, Weidenberg (DE)
Assigned to Concept Laser GmbH, Lichtenfels (DE)
Filed by Concept Laser GmbH, Lichtenfels (DE)
Filed on Nov. 13, 2023, as Appl. No. 18/507,239.
Application 18/507,239 is a division of application No. 16/293,640, filed on Mar. 6, 2019, granted, now 11,845,218.
Claims priority of application No. 18211595 (EP), filed on Dec. 11, 2018.
Prior Publication US 2024/0075682 A1, Mar. 7, 2024
Int. Cl. B29C 64/153 (2017.01); B22F 10/31 (2021.01); B22F 12/45 (2021.01); B29C 64/268 (2017.01); B29C 64/30 (2017.01); B33Y 40/00 (2020.01); B22F 10/32 (2021.01); B22F 10/36 (2021.01)
CPC B29C 64/153 (2017.08) [B22F 10/31 (2021.01); B22F 12/45 (2021.01); B29C 64/268 (2017.08); B29C 64/30 (2017.08); B33Y 40/00 (2014.12); B22F 10/32 (2021.01); B22F 10/36 (2021.01)] 19 Claims
OG exemplary drawing
 
1. An apparatus for additively manufacturing three-dimensional objects by means of successive layerwise selective irradiation and consolidation of layers of a build material which can be consolidated by means of an energy source, the apparatus comprising:
an irradiation device with at least a first and a second irradiation unit, wherein the first irradiation unit is configured to generate a plurality of first calibration patterns with a first energy beam at respectively different first locations of a test specimen, and wherein the second irradiation unit is configured to generate a plurality of second calibration patterns with a second energy beam at respectively different second locations of the test specimen; and
a determination unit configured to determine position information pertaining to the respective positions of the plurality of first calibration patterns and the plurality of the second calibration patterns, wherein the position information comprises a gap between (i) a first one of the plurality of first calibration patterns and (ii) a second one of the plurality of second calibration patterns, wherein the first one of the plurality of first calibration patterns is adjacent to the second one of the plurality of second calibration patterns, and wherein, based at least in part on the position information, the determination unit is configured to determine a calibration status of the irradiation device; and
wherein the apparatus is configured to adjust, for use in an additive manufacturing process, at least one irradiation parameter associated with the irradiation device based at least in part on the calibration status.