US 12,015,381 B2
Methods and apparatus for driver calibration
Seiji Takeuchi, Hashima (JP)
Assigned to SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC, Scottsdale, AZ (US)
Filed by SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC, Scottsdale, AZ (US)
Filed on Aug. 15, 2023, as Appl. No. 18/450,123.
Application 18/450,123 is a division of application No. 16/848,240, filed on Apr. 14, 2020, granted, now 11,770,105.
Application 16/848,240 is a continuation of application No. 16/002,179, filed on Jun. 7, 2018, granted, now 10,658,986, issued on May 19, 2020.
Prior Publication US 2023/0387865 A1, Nov. 30, 2023
Int. Cl. H03F 1/30 (2006.01); G03B 13/36 (2021.01); G05F 3/24 (2006.01); H02P 25/034 (2016.01); H03F 3/45 (2006.01); H03M 1/10 (2006.01)
CPC H03F 1/30 (2013.01) [G03B 13/36 (2013.01); G05F 3/24 (2013.01); H02P 25/034 (2016.02); H03F 3/45 (2013.01); H03F 2200/453 (2013.01); H03M 1/1009 (2013.01)] 20 Claims
OG exemplary drawing
 
15. An imaging system, comprising:
a lens;
an actuator configured to adjust a position of the lens;
a current comparator circuit including:
a first node having a first voltage, and
a second node having a second voltage;
a driver configured to control the actuator and including:
a first terminal responsive to the second voltage, and
a second terminal connected to a reference voltage; and
a replica circuit including:
a third terminal connected to the first node,
a fourth terminal connected to the second terminal of the driver, and
a fifth terminal connected to the first terminal of the driver.