US 12,013,800 B1
Die-to-die and chip-to-chip connectivity monitoring
Eyal Fayneh, Givatayim (IL); Guy Redler, Haifa (IL); and Evelyn Landman, Haifa (IL)
Assigned to PROTEANTECS LTD., Haifa (IL)
Filed by PROTEANTECS LTD., Haifa (IL)
Filed on Jun. 14, 2023, as Appl. No. 18/209,685.
Claims priority of provisional application 63/444,016, filed on Feb. 8, 2023.
Int. Cl. G06F 13/20 (2006.01); G01R 31/317 (2006.01)
CPC G06F 13/20 (2013.01) [G01R 31/31712 (2013.01); G01R 31/31725 (2013.01); G06F 2213/40 (2013.01)] 22 Claims
OG exemplary drawing
 
1. An input/output (I/O) sensor for a multi-IC (Integrated Circuit) module, the I/O sensor comprising:
a signal input, configured to receive a data signal from an interconnected part of an IC of the multi-IC module; and
a time duration measurement circuit, configured to measure a time duration between a first time, at which the data signal is at a first level, and a second time, at which the data signal is at a second level, different from the first level, wherein the time duration measurement circuit comprises:
a first comparator circuit, configured to generate a first timing signal having an edge when the received data signal is at a first provided level,
a second comparator circuit, configured to generate a second timing signal having an edge when the received data signal is at a second provided level, and
a timing measurement circuit, configured to receive the first and second timing signals and to measure a time between the edge of the first timing signal and the edge of the second timing signal, wherein the timing measurement circuit comprises:
delay circuitry, configured to receive the first timing signal and to generate a delayed data signal, the delay circuitry comprising an adjustable delay-line configured to delay an input signal by a set time span,
a comparison circuit, configured to generate a comparison signal by comparing the second timing signal with the delayed data signal, and
timing measurement processing logic, configured to set the time span of the adjustable delay-line and, based on the comparison signal, identify the time duration.