US 12,013,259 B2
Providing compensation parameters for sensor integrated circuits
Benjamin Kollmitzer, Graz (AT); Stephan Leisenheimer, Deisenhofen (DE); Mario Motz, Wernberg (AT); and Bernhard Schaffer, Villach (AT)
Assigned to Infineon Technologies AG, Neubiberg (DE)
Filed by Infineon Technologies AG, Neubiberg (DE)
Filed on Sep. 26, 2018, as Appl. No. 16/143,171.
Prior Publication US 2020/0096363 A1, Mar. 26, 2020
Int. Cl. G01D 3/02 (2006.01); H04B 1/04 (2006.01); H04B 1/16 (2006.01)
CPC G01D 3/022 (2013.01) [H04B 1/04 (2013.01); H04B 1/16 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A method, comprising:
determining, by a device, a first sensor identifier corresponding to a sensor integrated circuit (IC) associated with a sensor system,
wherein the sensor IC is produced at an IC production facility, and
wherein the sensor system is produced at a system production facility;
obtaining, by the device and based on the first sensor identifier, a signal representing raw compensation data, of first one or more compensation parameters associated with the sensor IC, during testing of the sensor IC;
obtaining, by the device and from the IC production facility, the first one or more compensation parameters determined by an IC testing device associated with the IC production facility,
wherein first verification information is determined based on the first one or more compensation parameters;
receiving, by the device, from the IC production facility, and via a first information channel, a first physical unclonable function (PUF) value of a PUF parameter associated with the sensor IC,
wherein the first PUF value is associated with a first output generated by the sensor IC based on a specific condition during the production of the sensor IC, and
wherein the first information channel is separate from a second channel via which the sensor IC is provided from the IC production facility to the system production facility;
storing, by the device, the received first PUF value;
receiving, by the device, from the system production facility, and via a second information channel, a second PUF value of the PUF parameter associated with a second output generated by the sensor IC based on the specific condition during production of the sensor system,
wherein the sensor system includes the sensor IC;
storing, by the device, the received second PUF value;
authenticating, by the device and based on comparing the first PUF value and the second PUF value, the sensor IC;
receiving, by the device and from the system production facility, a second sensor identifier determined by a system production device associated with the system production facility;
determining, by the device and based on the received second sensor identifier, second one or more compensation parameters;
providing, by the device and to the system production facility, the determined second one or more compensation parameters,
wherein second verification information is determined based on the second one or more compensation parameters, and
wherein the first verification information and the second verification information are compared for verification; and
storing, by the device, based on the verification, and based on authenticating the sensor IC, compensation parameter information, associated with the second one or more compensation parameters and including at least the raw compensation data and the PUF parameter, on a controller of the sensor system,
wherein the determining the first sensor identifier, and the determining the signal representing the raw compensation data occur during the production of the sensor IC,
wherein the authenticating the sensor IC, and the storing the compensation parameter information occur during the production of the sensor system, and
wherein the compensation parameter information and the second sensor identifier are used to correct a measurement, performed by the sensor IC, during use of the sensor system.