US 12,011,839 B1
Three-dimensional scanning system and scanning path planning method thereof
Jiangfeng Wang, Hangzhou (CN); Shangjian Chen, Hangzhou (CN); Chuanpeng Jiang, Hangzhou (CN); Zhe Zhang, Hangzhou (CN); and Jun Zheng, Hangzhou (CN)
Assigned to SCANTECH (HANGZHOU) CO., LTD., Hangzhou (CN)
Filed by SCANTECH (HANGZHOU) CO., LTD., Hangzhou (CN)
Filed on Aug. 18, 2023, as Appl. No. 18/452,400.
Claims priority of application No. 202310167066.9 (CN), filed on Feb. 15, 2023.
Int. Cl. B25J 9/16 (2006.01)
CPC B25J 9/1697 (2013.01) [B25J 9/1664 (2013.01)] 17 Claims
OG exemplary drawing
 
1. A three-dimensional scanning system comprising:
a control apparatus configured to determine a planned scanning path for a to-be-measured object based on a historical scanning path of an object type to which the current to-be-measured object belongs and according to a historical pose and a current pose of a rotary table carrying the to-be-measured object; and
a mechanical arm that drives a scanner to scan the to-be-measured object according to the planned scanning path under control of the control apparatus,
wherein the control apparatus is further configured to carry out effect verification on the planned scanning path to simulate acquisition of a three-dimensional model according to a preset position and speed of operation of the rotary table and the planned scanning path of the mechanical arm, and to determine whether to revise the position and speed of operation of the rotary table and the planned scanning path.