CPC A61N 1/0534 (2013.01) [A61N 1/36132 (2013.01); A61N 1/36135 (2013.01); A61N 1/36146 (2013.01); A61N 1/36157 (2013.01); A61N 1/36164 (2013.01); A61N 1/37241 (2013.01); A61N 1/37247 (2013.01); A61N 1/378 (2013.01); G06F 3/0482 (2013.01); G16H 10/60 (2018.01); G16H 40/40 (2018.01); A61N 1/36192 (2013.01); A61N 1/37252 (2013.01)] | 20 Claims |
1. A method of controlling delivery of deep brain stimulation to a patient, the method comprising:
providing, via a display of a clinician programmer device, one or more interface screens for guiding a user through testing of electrode configurations of electrodes of an implantable stimulation lead that is coupled to an implantable pulse generator, wherein the clinician programmer device includes wireless communication circuitry for conducting wireless communications with the implantable pulse generator after implantation within a patient;
controlling, via wireless communications from the clinician programmer device to the implantable pulse generator, delivery of deep brain stimulation to the patient by the implantable pulse generator, wherein controlling delivery of deep brain stimulation to the patient includes modifying a deep brain stimulation (DBS) pulse amplitude for each tested electrode configuration;
receiving a first input from a user of the clinician programmer device, wherein the first input includes at least identification of a therapeutic window for one or more DB S parameters for each tested electrode configuration, and wherein the therapeutic window is defined by one or more DBS parameters used for test stimulation for a DBS benefit and a DBS side effect experienced by the patient during testing; and
responsive to receiving a second input from the user of the clinician programmer device that identifies a side effect experienced by the patient for an electrode configuration under test, controlling delivery of deep brain stimulation to the patient by the implantable pulse generator by automatically decreasing the DBS pulse amplitude associated with the electrode configuration under test.
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