US 12,011,225 B2
Slit lamp microscope and ophthalmic system
Kazuhiro Oomori, Tokyo (JP); Yasufumi Fukuma, Wako (JP); and Hitoshi Shimizu, Tokyo (JP)
Assigned to TOPCON CORPORATION, Tokyo (JP)
Appl. No. 17/251,210
Filed by Topcon Corporation, Tokyo (JP)
PCT Filed Jun. 12, 2019, PCT No. PCT/JP2019/023199
§ 371(c)(1), (2) Date Dec. 11, 2020,
PCT Pub. No. WO2019/240148, PCT Pub. Date Dec. 19, 2019.
Claims priority of application No. 2018-112893 (JP), filed on Jun. 13, 2018.
Prior Publication US 2021/0153740 A1, May 27, 2021
Int. Cl. A61B 3/135 (2006.01); A61B 3/00 (2006.01); A61B 3/14 (2006.01)
CPC A61B 3/135 (2013.01) [A61B 3/0008 (2013.01); A61B 3/14 (2013.01)] 14 Claims
OG exemplary drawing
 
1. A slit lamp microscope comprising:
an illumination system configured to project slit light onto an anterior segment of an eye;
a photography system including an optical system and an image sensor, the optical system being configured to direct light coming from the anterior segment onto which the slit light is being projected, and the image sensor including a light detecting plane that receives the light directed by the optical system; and
a movement mechanism configured to move the illumination system and the photography system, wherein
a subject plane along an optical axis of the illumination system, the optical system, and the light detecting plane satisfy a Scheimpflug condition,
the photography system acquires a plurality of images of the anterior segment by performing repetitive photography in parallel with movement of the illumination system and the photography system performed by the movement mechanism,
the photography system includes a first photography system and a second photography system,
the first photography system includes a first optical system and a first image sensor, the first optical system being configured to direct the light coming from the anterior segment onto which the slit light is being projected, and the first image sensor including a first light detecting plane that receives the light directed by the first optical system, wherein the first photography system acquires a first image group by performing repetitive photography in parallel with the movement,
the second photography system includes a second optical system and a second image sensor, the second optical system being configured to direct the light coming from the anterior segment onto which the slit light is being projected, and the second image sensor including a second light detecting plane that receives the light directed by the second optical system, wherein the second photography system acquires a second image group by performing repetitive photography in parallel with the movement,
an orientation of an optical axis of the first optical system and an orientation of an optical axis of the second optical system are different from each other, and
the subject plane, the first optical system, and the first light detecting plane satisfy the Scheimpflug condition, and the subject plane, the second optical system, and the second light detecting plane satisfy the Scheimpflug condition.