| CPC H10D 89/713 (2025.01) | 18 Claims |

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1. A structure comprising:
a vertical silicon controlled rectifier comprising a diffusion region in a well of a semiconductor substrate;
a vertical triggering device sharing the diffusion region with the vertical silicon controlled rectifier; and
a body contact adjacent to the vertical triggering device and electrically connecting to the well,
wherein the vertical silicon controlled rectifier comprises a base with a first conductivity type, the vertical triggering device comprises a base with a second conductivity type, and the diffusion region comprises the first conductivity type, and
wherein a base of the silicon controller rectifier comprises P—SiGe, a base of the vertical triggering device comprises N—SiGe, the well comprises an n-well and the diffusion region comprises a p-type dopant.
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