US 12,335,628 B2
Imaging condition setting system, imaging condition setting method, and program
Yosuke Naruse, Kyoto (JP); and Koichi Taguchi, Kyoto (JP)
Assigned to OMRON CORPORATION, Kyoto (JP)
Appl. No. 18/260,772
Filed by OMRON CORPORATION, Kyoto (JP)
PCT Filed Sep. 14, 2021, PCT No. PCT/JP2021/033690
§ 371(c)(1), (2) Date Jul. 7, 2023,
PCT Pub. No. WO2022/163002, PCT Pub. Date Aug. 4, 2022.
Claims priority of application No. 2021-011384 (JP), filed on Jan. 27, 2021.
Prior Publication US 2024/0305893 A1, Sep. 12, 2024
Int. Cl. H04N 23/72 (2023.01); G01N 21/88 (2006.01); H04N 23/73 (2023.01); H04N 23/74 (2023.01)
CPC H04N 23/72 (2023.01) [G01N 21/8806 (2013.01); H04N 23/73 (2023.01); H04N 23/74 (2023.01); G01N 2021/8835 (2013.01)] 14 Claims
OG exemplary drawing
 
1. An imaging condition setting system, comprising:
an imager configured to capture an image of a workpiece being an inspection target;
an illuminator including a light source configured to illuminate the workpiece with light; and
an imaging condition setter configured to set an imaging condition to capture an image of the workpiece, the imaging condition setter being configured to set, for the image captured with light from the illuminator to the workpiece at a luminosity greater than or equal to a threshold, an exposure time of the imager to cause a value of a pixel in a specific area of the image of the workpiece to be within a specific range, wherein the imaging condition setter sets the exposure time of the imager to cause the value of the pixel in the specific area of the image of the workpiece to be within the specific range based on a difference between an image captured with light from the illuminator to the workpiece at a luminosity greater than or equal to the threshold and an image captured with light from the illuminator to the workpiece at a minimum luminosity.