US 12,334,915 B2
High side current detection circuit, overcurrent protection circuit, calibration method and electronic devices
Dongming Liu, Foshan (CN)
Assigned to Halo Microelectronics Co., Ltd., Foshan (CN)
Filed by Halo Microelectronics Co., Ltd, Foshan (CN)
Filed on Sep. 25, 2023, as Appl. No. 18/372,608.
Claims priority of application No. 202211681541.6 (CN), filed on Dec. 27, 2022.
Prior Publication US 2024/0213976 A1, Jun. 27, 2024
Int. Cl. G05F 1/573 (2006.01); H03K 17/081 (2006.01); H03K 17/082 (2006.01); H03K 17/687 (2006.01)
CPC H03K 17/0822 (2013.01) [G05F 1/573 (2013.01); H03K 17/08104 (2013.01); H03K 17/687 (2013.01); H03K 2217/0027 (2013.01); H03K 2217/0063 (2013.01)] 20 Claims
OG exemplary drawing
 
8. A calibration method for calibrating an overcurrent protection circuit, the calibration method comprising:
obtaining an offset error of the overcurrent protection circuit by changing a current limiting state of the overcurrent protection circuit;
adjusting an offset compensation circuit to calibrate the offset error of the overcurrent protection circuit; and
adjusting a gain calibration circuit based on the current limiting state of the overcurrent protection circuit to calibrate a gain error of the overcurrent protection circuit, wherein the overcurrent protection circuit comprises a first transistor, a second transistor, a third transistor, a first operational amplifier, a gain calibration circuit, an offset compensation circuit, and a driving circuit, and wherein:
the driving circuit is configured to receive a signal generated by the gain calibration circuit and generate a gate drive signal applied to the first transistor and the third transistor.