| CPC H01L 24/27 (2013.01) [H01L 21/6835 (2013.01); H01L 22/14 (2013.01); H01L 23/481 (2013.01); H01L 24/03 (2013.01); H01L 24/05 (2013.01); H01L 24/06 (2013.01); H01L 24/30 (2013.01); H01L 2224/0384 (2013.01); H01L 2224/0401 (2013.01); H01L 2224/05624 (2013.01); H01L 2224/06515 (2013.01); H01L 2224/275 (2013.01); H01L 2224/30181 (2013.01); H01L 2924/30105 (2013.01); H01L 2924/35121 (2013.01); H01L 2924/37001 (2013.01)] | 20 Claims |

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1. A semiconductor package comprising:
a semiconductor substrate disposed over a package component;
an interconnect structure disposed over the semiconductor substrate, the interconnect structure electrically connected to integrated circuit devices at a surface of the semiconductor substrate;
a first aluminum pad disposed over the semiconductor substrate and electrically connected to the interconnect structure, the first aluminum pad comprising:
a top major surface opposite the semiconductor substrate;
a first recess in the top major surface extending toward the semiconductor substrate; and
a protrusion from the top major surface extending away from the semiconductor substrate;
a second aluminum pad disposed over the semiconductor substrate and electrically connected to the interconnect structure; and
a first dielectric bond layer disposed over and around the first aluminum pad and the second aluminum pad.
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